NANOPHOX

Sympatec NANOPHOX, 0.5 - 10,000 nm, dynamic light scattering sensor

Unit Price
On Request
Supplier
SYMPATEC
Country of origin
Germany
Unit of Measurement
PIECE
Delivery time
16 - 20 weeks
Validity Until
31.12.2024
In general, the acquisition of scattered light intensities of particles under thermal motion is deployed for nanoparticle characterisation (principle of dynamic light scattering (DLS)). Sympatec NANOPHOX brings Photon Cross-correlation Spectroscopy (PCCS) to life, which allows for high resolution nanoparticle size analysis in high concentrated suspensions and emulsions ranging from 0.5 nm to 10,000 nm with minimum sample preparation.
Sympatec NANOPHOX, 0.5 - 10,000 nm, dynamic light scattering sensor
Sympatec NANOPHOX, 0.5 - 10,000 nm, dynamic light scattering sensor
Sympatec NANOPHOX, 0.5 - 10,000 nm, dynamic light scattering sensor
Technical Data
  • Overall measuring range [nm] 0.5 - 10,000
  • Principle Dynamic Light Scattering
  • Illuminate the same volume by 2 sepearate laser beams
  • Intensity fluctuations recorded by 2 independent detectors
  • Cross-correlation of the two separately acquired intensity patterns in order to determine particle size
  • Elimination of multiple scattering effects
  • In accordance with ISO 22412
  • Light source Helium-neon laser λ = 632.8 nm (Red)
  • Protection class 1
  • Two optical paths via beam splitter & alignment-free optics
  • Temperature-controlled water basin
  • Temperature range [oC] 15-40 (typical) 22-25 (recommended)
  • Temperature stability [oC] ±0.05
  • Temperature accuracy [oC] ±0.1 at 20oC
  • Disposable micro vial 50µl to 2ml
  • Glass vial (crown glass) up to 4ml
  • Disposable vial (acrylic glass) up to 4ml
  • Via holder X/Y-table, positionable relative to laser beam
  • Scattering volume approx. 5.5 x 10-4 µl
  • Sample concentration < 1% up to approx. 20% by volume
  • Photo detector, avalanche photo diodes with subsequent correlator
  • Scattering angle 90o
  • Measuring time 2min. (typical) and more
  • 3D cross-correlation technique providing diverse evaluation algorithms
  • Accuracy <2%, repeatability <1.5%
  • Compliant with ISO 22412 for the complete size range
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